Scanning Electron Microscopy (SEM)
The Hitachi S-3400N is a 0.3-30Kv variable pressure (VP) SEM operating with a tungsten filament electron source. The S-3400N’s large specimen chamber accommodates traditional dried gold-coated samples for examination in secondary electron (SE) mode and wet and/or non-conductive samples without metal coating for examination in VP mode. The S-3400N features both SE imaging as well as a solid state backscattered electron (BSE) detector, real time image display with signal mixing and a computer eucentric motorized stage with -20/+90 degree tilt.
Taken on the Hitachi S-3400N SEM